Product name:
EX-QS Wafer Mapping Sensor from HAMA Sensors(tm)

Company: CyberOptics Semiconductor, Inc.
Added by: Lindsey Dietz
Date: 2008-08-12 15:40:14
Views: 73

Specifications

The HAMA Sensors(tm) EX-QS is an EX-Q wafer mapping sensor repackaged in a smaller case to accommodate applications where space is limited, or where a smaller sensor footprint is desired.The EX-QS enables reliable detection of semiconductor wafers and slotting errors in cassettes or FOUPs. It can be used with mixed wafer batches, for example dark or coated wafers can be combined with bright wafers and it is compatible with flatted or notched wafers of any size including 300mm.

Price : not set