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DX4065 Z-Meter for measuring and QC of thermoelectric elements

Dx4065 Z-meter for Measuring and Qc of Thermoelectric Elements

TEC Microsystems GmbH >>

Description

 

Z-Meters - devices for examination of performance and reliability parameters of TE modules. Z-Meters have extended capabilities, many useful functions for fast and accurate testing of various types of thermoelectric modules.

The following parameters of thermoelectric modules can be measured:

  •  
    • AC Resistance (R) 
    • Thermoelectric Figure-of-Merit (Z) 
    • Maximum Temperature Difference (dTmax)
    • Time Constant of TE Modules (t)

 

The Z parameter and dTmax result from  Harman method concept. Advanced technique developed in RMT allows precise characterization of single-stage and two-stage TE modules, measurement of AC resistance and time constant in a wide range.
Additionally, it is possible to evaluate quality of three or more-stage TE modules by the measurement of electrical resistance and time constant.

 

 

Advantages

 

  • ‣Testing of single stage and multi-stage     thermoelectric modules
  • ‣Performance of TE modules integrated into devices (photodetectors, lasers and other TE cooled parts)
  • ‣Time constant measurement
  • ‣Single point (DX4065) and Multi-point (DX4165) device models

 

Features

 

  • ‣Current adjustable in a range 0...200 mA 
  • ‣Measurement at direct and reversed current
  • ‣Results normalization to standard temperatures
  • ‣Correction coefficients to Z value
  • ‣Compact design
  • ‣Low power consumption 

 

 

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