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Read full testimonial »Vawi-ret Microinterferometer
INOS >>Description
VAWI-RET microinterferometer is a precise measuring tool for large-scale manufacturers of accurate phase plates (retardation plates) like quarter-wave plates, half-wave plates etc. l/200 accuracy, complete retardation characteristics for full wavelength range (400-1600nm) in a single measurement and easy operation are key features of this device.VAriable-Wavelength Interferometric (VAWI) methods were invented in early 1980s in the Institute of Applied Optics – INOS by the late Prof. M. Pluta, famous physicist and specialist in light microscopy, an author of three-volume monography “Advanced Light Microscopy” by Elsevier Science Publishers B.V., 1990-93. VAWI techniques allow to measure very accurately (one or even two orders more accurately than by traditional techniques) the optical path difference or phase difference. Consequently the refractive indices and their spectral dispersion, birefringence and its spectral dispersion, retardation, optical path length, and width of objects for wide range of different materials can be determined more accurately. The method is especially useful for objects with some type of discontinuities e.g. strips, fibres etc., where it is impossible to identify the fringe orders in the object image. One of the most important features of this method is the fact that the only parameter, which is directly measured is the interfringe spacing, while other quantities, which lead to the final interferometric results are derived from quite simple formulas. VAWI microinterferometers are especially useful in: materials sciences, chemistry and photo-chemistry, optics (technology and testing), semiconductor technology, textile and optical fibres technology, biomedicine, crystallography and mineralogy, studies of surface roughness of flat and cylindrical objects, testing spherical shells for laser-fusion experiments and examinations of many other specific objects and materials used in high-tech research. Due to a wide application potential VAWI microinterferometers can be developed by the manufacturer to suit specific customer’s needs and perform various measuring/inspection tasks.
| Product line: | Imaging, Cameras and Displays |
|---|---|
| Subcategories: | Microscopes Interference |
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