Photonic Sourcing

The CRAIC Elixir™ solution integrates an advanced spectrophotometer with an optical microscope and powerful yet easy-to-use software to enable the forensic scientist to analyze all manner of microscopic samples of trace evidence. With high sens...

These new scanning UV-VIS-NIR spectrophotometers were designed for solving a broad range of tasks in modern laboratory. These spectrophotometers ideally suite а variety of general-purpose, routine and research application, connected with registrat...

The CRAIC Apollo™ Raman spectrometer is designed for fast, easy micro-Raman spectroscopy. As such, it is perfect for research, metrology and inspection of microscopic sampling areas by Raman spectroscopy. The CRAIC Apollo™ Raman spectrome...

The 20/20 PV™ microspectrophotometer allows you to image and measure spectra by absorbance, reflectance, fluorescence and emission from the deep ultraviolet to the near infrared of sub-micron sized sample features automatically. The innovative...

Full Spectral Analysis in a Tiny FootprintThe new STS Microspectrometer is a remarkably small CMOS-based unit that is less than 50 mm square and weighs just over 2 ounces/68g. This ultra-compact spectrometer is ideal for OEM devices and provides full...

Adding spectroscopy to your microscope™The 308 PV™ Microscope Spectrophotometer is designed to add spectroscopy, color imaging, thin film thickness measurement and colorimetry capabilities to your optical microscope or probe station. It c...

Ultraviolet Radiation SpectrometerQuickly and easily measure vacuum ultraviolet spectral emission (signature emission from He, Ar, Xe, N2, O2, etc. and even many corrosive fluoride or chloride-based mixtures) in experiments as diverse as: plasma proc...

Dramatic savings without sacrificing performance. A rugged workhorse, BaySpec SuperGamut NIR Spectrometers are based on transmission Volume Phase Gratings featuring compact size, fast f/2 optics, excellent repeatibility, and we are passing our volume...

Simultaneous Reflectance and Transmittance Analysis for Vacuum CoatingsThe F10-VC measures reflectance and transmittance simultaneously and is designed especially for vacuum coating applications. This low-cost system can be upgraded with fil...

Table-Top Systems for Thickness and Index Measurements The F20 line are our workhorse general-purpose instruments suitable for a wide range of applications. Choose the F20 system (F20-UV, F20, F20-NIR, or F20-EXR) with the best thickness or wavelen...