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Testimonials
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Read full testimonial »Test and Measurement Equipment | Reflectometers
The CRAIC Elixir™ solution integrates an advanced spectrophotometer with an optical microscope and powerful yet easy-to-use software to enable the forensic scientist to analyze all manner of microscopic samples of trace evidence. With high sens...
CRAIC Technologies
To develop vacuum ultraviolet excitable phosphors the Institute of Low Temperature and Structure, Polish Academy of Science contracted McPherson to build a characterization system for the 120nm to 1800nm range. The benign discharge of a noble gas wil...
McPherson, Inc.
The 20/20 PV™ microspectrophotometer allows you to image and measure spectra by absorbance, reflectance, fluorescence and emission from the deep ultraviolet to the near infrared of sub-micron sized sample features automatically. The innovative...
CRAIC Technologies
Adding photometry to your microscope™The CRAIC MP-2™ Microscope Photometer is designed to add photometry and imaging to your optical microscope. Actually, the CRAIC MP-2™ is better described as a microscope radiometer in that it has...
CRAIC Technologies
Ultraviolet Radiation SpectrometerQuickly and easily measure vacuum ultraviolet spectral emission (signature emission from He, Ar, Xe, N2, O2, etc. and even many corrosive fluoride or chloride-based mixtures) in experiments as diverse as: plasma proc...
McPherson, Inc.
Simultaneous Reflectance and Transmittance Analysis for Vacuum CoatingsThe F10-VC measures reflectance and transmittance simultaneously and is designed especially for vacuum coating applications. This low-cost system can be upgraded with fil...
Filmetrics Inc
Table-Top Systems for Thickness and Index Measurements The F20 line are our workhorse general-purpose instruments suitable for a wide range of applications. Choose the F20 system (F20-UV, F20, F20-NIR, or F20-EXR) with the best thickness or wavelen...
Filmetrics Inc
Affordable System for Analyzing Anti-Reflective Coatings and Hardcoats The F10-AR measures hardcoat thickness and analyzes antireflective coatings on a wide variety of substrates to determine conformance to user-provided...
Filmetrics Inc
An Advanced Thin-Film Measurement System at an Affordable PriceThe F10-HC is specifically designed to measure single and multiple layers (e.g., primer/hardcoat) encountered in thick film applications. Please e-mail info@filmetrics.com or call 858-573...
Filmetrics Inc
In-situ Deposition and Etch Monitor The F30 measures deposition rates, layer thickness, optical constants (n and k) and uniformity of semiconductor and dielectric layers in real time. Please e-mail info@filmetrics.com or call...
Filmetrics Inc
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