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Product Name Description Date
Innovative 705nm Laser Diode for Biomedical Measurement
Photonic Products, the UK opto-electronics device manufacturer and laser diode specialist, is delighted to be the authorised distributor of the first 705nm semiconductor laser diode from Opnext. This 2008-08-20 06:53:22
QDI 302 Microscope Spectrophotometer
The QDI 302 is a UV-visible-NIR range spectrophotometer designed to add spectroscopic capabilities to a microscope or probe station. Depending upon the configuration of the microscope, this system ca 2008-08-14 14:08:04
UVM-1 UV-visible-NIR Microscope
The UVM-1 is a UV-visible-NIR range microscope. Able to acquire images from the deep ultraviolet far into the NIR region (to 2500 nm) with transmission, reflectance and even fluorescence illumination 2008-08-14 13:57:28
QDI 2010 UV-visible-NIR microspectrophotometers
The QDI 2010 is designed to measure the spectra of microscopic sampling areas in the UV, visible and NIR regions by transmission, reflectance and fluorescence. UV and NIR imaging may also be added to 2008-08-14 13:53:32
ElkLight MODEL C-57
PRESS RELEASE - FOR IMMEDIATE RELEASE DATELINE: MELBOURNE, FLORIDA TOPIC: INREDIBLE BREAKTHROUGH IN ENERGY EFFICIENT LIGHTING; BRIGHTEST (LITTLE) LIGHT IN THE WORLD? GREEN ENERGY ANSWERS!    2008-08-13 13:08:59
World’s First 642nm 150mW Laser Diode
World’s First 642nm 150mW Laser Diode Launched by Photonic Products Photonic Products, the UK opto-electronics device manufacturer and laser diode specialist, is delighted to be the authorised 2008-08-13 10:47:15
EX-QS Wafer Mapping Sensor from HAMA Sensors(tm)
The HAMA Sensors(tm) EX-QS is an EX-Q wafer mapping sensor repackaged in a smaller case to accommodate applications where space is limited, or where a smaller sensor footprint is desired.The EX-QS ena 2008-08-12 15:40:14
EX-Q Wafer Mapping Sensor
The EX-Q wafer mapping sensor, featuring reflective laser technology, enables quick and reliable detection of semiconductor wafers and slotting errors in cassettes or FOUPs. Available in four standoff 2008-08-12 15:36:02
WaferSense(tm) Auto Gapping System (AGS)
WaferSenseTM AGS measures gaps that are critical to the outcome of semiconductor processes such as thin-film deposition, sputtering and etch. It uses a capacitive sensing technique (patent pending) th 2008-08-12 15:29:37
WaferSense(tm) Auto Leveling System 2 Vertical (ALS2V)
WaferSense™ ALS2 Vertical moves through your semiconductor process equipment to take critical inclination measurements. Wafer-like, it is compatible with your existing automation, while its wireles 2008-08-12 15:24:35
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